[1] AFSC Design Handbook 1-4 Electromagnetic Compatibility.
July 15, 1987. (Design notes 5D2, 5D3, 5F6)
Keywords: Bonding, Corrosion, Galvanic Series, Gaskets, Shielding.
[2] Designing for Immunity to Pulsed EMI. Keytek Instrument
Corp., Wilmington, MA, 1990.
Keywords: Antennas, Balance, Blocking, Bonding, Cables, Capacitive coupling,
Capacitors, Checksums, Clamps, Common-impedance coupling, Common-mode,
Conductive fillers, Conductive paints, Conductive plating, Controls,
Corrosion, Crowbars, Differential mode, Disabled states, Double-sided boards,
Edge-triggered logic, Enclosures/housings, Error-correcting codes (ECC), Error
detection, Error recovery, ESD current, ESD damage, ESD energy, ESD risetime,
ESD testing, ESD upsets, ESD voltage, Fail safe, Feedthrough capacitors,
Ferrite beads/sleeves, Filters, Floating inputs, Framing, Galvanic series, Gas
tubes, Gaskets, Ground grids, Ground planes, Grounding, Handshaking,
Inductance, Inductive coupling, Intermittent errors, Loop area, Metal-oxide
varistors (MOV's), Multilayer boards, Noise immunity, Openings, Optoisolators,
Parity, Pigtails, Redundancy, Refreshing, Response time, Sampling data, Seams,
Secondary arcs, Shielding, Shunting, Slots, Spacing, Spark gaps, Tokens,
Transient voltage suppressors (TVS's), Transposing lines, Twisted pairs,
Unused memory, Wait states, Watchdog timers.
[3] Electrostatic Discharge (ESD) Protection Test Handbook, 2nd
ed. KeyTek Instruments Corp., Burlington, MA, 1986.
Keywords: Air discharge, Bipolar devices, Cable routing, Cables, Capacitance,
Capacitors, Case histories, Charge injection, CMOS devices, Contact discharge,
Controls, Corona, Charge injection, Direct discharge, Electric field,
Electromagnetic pulse (EMP) protection, ESD charge, ESD current, ESD damage,
ESD duration, ESD energy, ESD immunity, ESD risetime, ESD simulator (human
body model), ESD standards, ESD testing, ESD upsets, ESD voltage, ESD
waveform, Furniture ESD, Ground planes, Ground wires, Grounding, Hand/tool
model, Human body model (HBM), Humidity, Inductive coupling, Keyboards,
Lead-length effects, Loop area, Magnetic field, Memory errors, Metal-oxide
varistors (MOV's), Shielding, Showering arcs, Spacing, Switches, Transient
voltage suppressors (TVS's), Triboelectric charging, Triboelectric series.
[4] Ionization and Electrostatic Charge Control in the Semiconductor Industry. Simco, Hatfield, PA.
[5] Motorola TVS/Zener Device Data, 2nd ed. Motorola, 1994.
(Chapter 10, pages 11-62 to 11-80)
Keywords: Capacitance, Clamping voltage, Clamps, CMOS devices, Computer
crashes, Crowbars, ESD charge, ESD damage, ESD duration, ESD immunity, ESD
risetime, ESD voltage, Gas tubes, Hand/tool model, Human body model (HBM),
Keyboards, Leakage current, Metal-oxide varistors (MOV's), MOSFET's,
Optoisolators, Shock threshold, Shunting, Spark gaps, Thyristors, Transient
voltage suppressors (TVS's), Zener diodes.
[6] Pulsed EMI Handbook. KeyTek Instrument Corp., Wilmington,
MA, 1991.
Keywords: Air discharge, Arcing, Cables, Charge injection, Contact discharge,
Direct discharge, ESD duration, ESD risetime, ESD simulator (crossed-vane),
ESD standards, ESD testing, ESD voltage, ESD waveform, Furniture ESD,
Hand/tool model, Human body model (HBM), Indirect discharge.
[7] Pulsed EMI Handbook, 4th ed.. KeyTek Instrument Corp.,
Wilmington, MA.
Keywords: Air discharge, Arcing, Cables, Charge injection, Contact discharge,
Direct discharge, ESD duration, ESD risetime, ESD simulator (crossed-vane),
ESD standards, ESD testing, ESD voltage, ESD waveform, Furniture ESD,
Hand/tool model, Human body model (HBM), Indirect discharge.
[8] Sony Semiconductor Quality and Reliability Handbook, Sony, Oct. 2000. (download from http://www.sony.co.jp/en/Products/SC-HP/QR/)
[9] Surge Protection Test Handbook. KeyTek Instrument Corp.,
Burlington, MA, 1982.
Keywords: Clamps, Crowbars, Gas tubes, Metal-oxide varistors (MOV's),
Thyristors, Transient voltage suppressors (TVS's).
[10] Testing for Pulsed EMI Immunity. Keytek Instrument
Corp., Wilmington, MA, 1990.
Keywords: Air discharge, Cable entry points, Contact discharge, Controls,
Diagnostics, Direct discharge, ESD charge, ESD duration, ESD energy, ESD
risetime, ESD simulator (crossed-vane), ESD standards, ESD testing, ESD
voltage, ESD waveform, Ferrite beads/sleeves, Furniture ESD, Hand/tool model,
Human body model (HBM), Indicators, Indirect discharge, Keyboards, Openings,
Seams, Switches, Triboelectric charging.
[11] Transient Voltage Suppression Devices. Harris
Semiconductor, 1994. (Chapters 1-7 & Application Notes, pages 1-1 to 7-17 and
11-1 to 12-63)
Keywords: Capacitance, Capacitors, Clamping voltage, Clamps, CMOS devices,
Crowbars, ESD damage, ESD duration, ESD energy, ESD immunity, ESD voltage,
Filters, Gas tubes, Human body model (HBM), Latch-up, Lead-length effects,
Leakage current, Loop area, Machine Model (MM), Metal-oxide varistors (MOV's),
Resistors, Response time, Spark gaps, Transient voltage suppressors (TVS's),
Zener diodes.
[12] Amerasekera, Ajith, and Duvvury, Charvaka, ESD in Silicon
Integrated Circuits. John Wiley & Sons, New York, 1995. (Chapters 1 &
2, pages 1-27)
Keywords: Charged device model (CDM), ESD charge, ESD current, ESD damage,
ESD duration, ESD immunity, ESD simulator (charged device model), ESD
simulator (human body model), ESD simulator (machine model), ESD simulator
(transmission line pulse), ESD testing, ESD voltage, Failure modes, Human body
model (HBM), Latch-up, Leakage current, Machine Model (MM), Scaling laws.
[13] Antinone, Robert J., et al, Electrical Overstress Protection for
Electronic Devices. Noyes Publications, Park Ridge, NJ, 1986. (pages
11-16, 386-390)
Keywords: Capacitance, Charged device model (CDM), ESD current, ESD damage,
ESD energy, ESD voltage, Human body model (HBM).
[14] ASM International, Metals Handbook 9th edition Volume 2 Properties and Selection: Nonferrous Alloys and Pure Metals. ASM International, Metals Park, OH, 1987.
[15] ASM International, Metals Handbook 9th edition Volume 13
Corrosion. ASM International, Metals Park, OH, 1987.
Keywords: Corrosion, Galvanic series.
[16] Bakoglu, H. B., Circuits, Interconnections, and Packaging for
VLSI. Addison-Wesley, New York, 1990. (Section 2.5, pages 41-53)
Keywords: ESD damage, Latch-up, Scaling laws.
[17] Barnes, John R., Electronic System Design: Interference and
Noise Control Techniques. Prentice-Hall, Englewood Cliffs, NJ, 1987.
Keywords: Bonding, Corrosion, Galvanic series, Gaskets, Openings, Seams,
Shielding.
[18] Bhar, Tarak N., and McMahon, Edward J., Electrostatic Discharge Control. Hayden Book Compant, Rochelle Park, NJ, 1983.
[19] Boxleitner, Warren, Electrostatic Discharge and Electronic
Equipment-- A Practical Guide for Designing to Prevent ESD Problems.
IEEE Press, New York, 1989.
Keywords: Air discharge, Antennas, Arcing, Bonding, Bypassing/decoupling,
Cables, Capacitance, Capacitors, Charge injection, Conductive plating,
Connectors, Contact discharge, Corona, Corrosion, Derating components, Direct
discharge, Electric field, Enclosures/housings, ESD current, ESD duration, ESD
frequency range, ESD risetime, ESD simulator (human body model), ESD testing,
ESD voltage, ESD waveform, Failure modes, Fault tolerance, Ferrite
beads/sleeves, Filters, Furniture ESD, Galvanic series, Gaskets, Ground
planes, Grounding, Human body model (HBM), Keyboards, Lock-ups, Loop area,
Magnetic field, Printed circuit boards (PCB's), Resets, Seams, Secondary arcs,
Shielding, Showering arcs, Slots, Software, Spacing, Triboelectric charging.
[20] Buchanan, James E., BiCMOS/CMOS Systems Design.
McGraw-Hill, New York, 1991. (Section 3-4-3.5, pages 46-51)
Keywords: ESD immunity, Floating inputs, Ground planes, Grounding, Latch-up,
Resistors, Zener diodes.
[21] Buchanan, James E., CMOS/TTL Digital Systems Design.
McGraw-Hill, New York, 1990. (section 3-2-5, pages 55-58)
Keywords: Floating inputs, Latch-up, Resistors.
[22] Buchanan, James E., Signal and Power Integrity in Digital
Systems. McGraw-Hill, New York, 1996. (sections 3.6 and 5.9, pages
64-68 108-112)
Keywords: ESD immunity, Floating inputs, Grounding, Latch-up, Resistors.
[23] Chomerics, EMI Shielding for Military/Aerospace
Electronics, 1998. (download from http://www.chomerics.com/)
Keywords: Bonding, Cables, Conductive coatings, Corrosion, Galvanic series,
Gaskets, Grounding, Tapes.
[24] Christopoulos, Christos, Principles and Techniques of Electromagnetic Compatibility. CRC Press, Ann Arbor, MI, 1995.
[25] Cobine, James Dillon, Gaseous Conductors. Dover, New York, 1958.
[26] Compliance Design, Handbook of EC EMC Compliance.
Compliance Design, Boxborough, MA, 1993. (Meeting the NEW EC Immunity
Requirements, pages 17-22, and Designing for Electrostatic Discharge Immunity,
pages 53-58)
Keywords: Arcing, Cables, Capacitors, Charge injection, Checkpoints, Direct
discharge, Electric field, Enclosures/housings, ESD current, ESD damage, ESD
risetime, ESD upsets, Fault tolerance, Ferrite beads/sleeves, Filters,
Furniture ESD, Grounding, Guard rings, Indirect discharge, Keyboards,
Lead-length effects, Magnetic field, Openings, Redundancy, Resistors, Rounded
corners, Sampling data, Seams, Shielding, Spacing, Strobing data, Unused
memory, Watchdog timers.
[27] Compliance Design, Handbook of EU EMC Compliance.
Compliance Design, Boxborough, MA, 1995. (Meeting the New EU Immunity
Requirements, Appendix 4, Appendix 6, pages 18-23, 47-49, 52-57)
Keywords: Air discharge, Cables, Capacitors, Charge injection, Checkpoints,
Conductive coatings, Conductive plating, Electric field, ESD current, ESD
damage, ESD risetime, ESD standards, ESD testing, ESD upsets, ESD waveform,
Failure modes, Fault tolerance, Ferrite beads/sleeves, Filters, Furniture ESD,
Grounding, Guard rings, Human body model (HBM), Indirect discharge, Keyboards,
Magnetic field, Openings, Redundancy, Resistors, Rounded corners, Sampling
data, Seams, Shielding, Software, Spacing, Strobing data, Unused memory,
Watchdog timers.
[28] Compliance Design, Handbook of EU EMC Compliance. Compliance Design, Boxborough, MA, 1996.
[29] Corp, M. Bruce, Zzaap! Taming ESD, RFI, and EMI.
Academic Press, New York, 1990.
Keywords: Bypassing/decoupling, Cables, Computer crashes, Derating
components, Direct discharge, ESD damage, ESD standards, ESD testing, ESD
upsets, Fail safe, Ground planes, Grounding, Heatsinks, Indirect discharge,
Lead-length effects, Metal-oxide varistors (MOV's), Power distribution,
Printed circuit boards (PCB's), Shielding, Spacing, Substitute parts,
Triboelectric charging, Zener diodes.
[30] Dabral, Sanjay, and Maloney, Timothy J., Basic ESD and I/O
Design. John Wiley & Sons, New York, 1998.
Keywords: Capacitors, Charged device model (CDM), ESD current, ESD damage,
ESD energy, ESD frequency range, ESD immunity, ESD risetime, ESD simulator
(charged device model), ESD simulator (human body model), ESD simulator
(transmission line pulse), Human body model (HBM), Latch-up, Leakage current,
Machine Model (MM), Scaling laws, Spark gaps.
[31] Dally, William J., Digital Systems Engineering.
Cambridge University Press, Cambridge, UK, 1998. (section 11.4, pages
548-558)
Keywords: ESD duration, ESD simulator (human body model), ESD simulator
(machine model), ESD waveform, Field-induced breakdown (FIB).
[32] Diaz, Carlos H., Kang, S. M. (Steve), Duvvury, Charvaka,
Modeling of Electrical Overstress in Integrated Circuits. Kluwer
Academic Publishers, Boston, 1995.
Keywords: Bibliography, Bipolar devices, Charged device model (CDM), CMOS
devices, ESD current path, ESD damage, ESD duration, ESD immunity, ESD
simulator (charged device model), ESD simulator (human body model), ESD
simulator (machine model), ESD testing, Failure modes, Field-induced breakdown
(FIB), Human body model (HBM), Input protection, Latch-up, Leakage current,
Machine Model (MM), Output protection, Power protection, Scaling laws.
[33] Eckert, Jeffrey K., Commercial EMC Standards of the United
States, Volume 9. Interference Control Technologies, Gainesville, VA,
1988.
Keywords: Corrosion, Gas tubes, Gaskets, Metal-oxide varistors (MOV's).
[34] Ficchi, Rocco F., Practical Design for Electromagnetic
Compatibility. Hayden Book Company, New York, 1971. (section 10-4,
page 173)
Keywords: Human body model (HBM), Humidity.
[35] Gabrielson, Bruce C., The Aerospace Engineer's Handbook of Lightning Protection. Interference Control Technologies, Gainesville, VA, 1988.
[36] Georgopoulos, Chris J., Fiber Optics and Optical Isolators. Don White Consultants, Gainesville, VA, 1982.
[37] Goedblood, Jasper, Electromagnetic Compatibility.
Prentice Hall, New York, 1990. (sections 11.2.1.3-11.3.2, pages 306-327)
Keywords: Connectors, Corona, Direct discharge, Electric field, ESD charge,
ESD damage, ESD duration, ESD energy, ESD frequency range, ESD immunity, ESD
risetime, ESD simulator (other), ESD testing, ESD upsets, ESD voltage, ESD
waveform, Filters, Gas tubes, Human body model (HBM), Humidity, Magnetic
field, Metal-oxide varistors (MOV's), Spacing, Spark gaps, Transient voltage
suppressors (TVS's), Triboelectric charging, Weather, Zener diodes.
[38] Greason, William D., Electrostatic Damage in Electronics:
Devices and Systems. John Wiley & Sons, New York, 1987.
Keywords: Antennas, Arcing, Bypassing/decoupling, Cables, Capacitance,
Capacitors, Charged device model (CDM), Checkpoints, Clamps, Connectors,
Controls, Corona, Crowbars, Electric field, Error-correcting codes (ECC), ESD
charge, ESD current, ESD damage, ESD duration, ESD energy, ESD frequency
range, ESD immunity, ESD risetime, ESD simulator (charged device model), ESD
simulator (crossed-vane), ESD simulator (human body model), ESD standards, ESD
testing, ESD upsets, ESD voltage, Failure modes, Fault tolerance,
Field-induced breakdown (FIB), Floating inputs, Furniture ESD, Gas tubes,
Gaskets, Grounding, Hand/tool model, Human body model (HBM), Indicators,
Induced charge, Keyboards, Latch-up, Lead-length effects, Loop area, Magnetic
field, Metal-oxide varistors (MOV's), Openings, Printed circuit boards
(PCB's), Redundancy, Resistors, Sampling data, Scaling laws, Seams, Secondary
arcs, Shielding, Software, Spacing, Spark gaps, Transient voltage suppressors
(TVS's), Triboelectric charging, Unused memory, Watchdog timers, Zener diodes.
[39] Greason, William D., Electrostatic Discharge in
Electronics. John Wiley & Sons, New York, 1992.
Keywords: Air discharge, Arcing, Bibliography, Breakdown strength,
Capacitance, Capacitive coupling, Charge injection, Charged device model
(CDM), Checkpoints, CMOS devices, Conductive charging, Contact discharge,
Current probes, Dipole model, Direct discharge, Electric field, Error
detection, Error recovery, ESD charge, ESD current, ESD damage, ESD duration,
ESD monitor, ESD risetime, ESD severity levels, ESD simulator (crossed-vane),
ESD simulator (furniture ESD), ESD simulator (human body model), ESD sources,
ESD standards, ESD testing, ESD upsets, ESD voltage, ESD waveform, Failure
modes, Fault tolerance, Field-induced breakdown (FIB), Furniture ESD,
Grounding, Hand/tool model, Human body model (HBM), Indirect discharge,
Inductive coupling, Input protection, Intermittent errors, Magnetic field,
Potential, Shielding, Software, Triboelectric charging, Work function.
[40] Hart, William C., and Malone, Edgar W., Lightning and Lightning Protection. Don White Consultants, Gainesville, VA, 1988.
[41] Hartal, Oren, Electromagnetic Compatibility By Design 4th
ed.. R&B Enterprises, West Conshohocken, PA, 1996.
Keywords: Arcing, Bonding, Cables, Capacitors, Charge injection, Connectors,
Controls, Corona, Electric field, ESD damage, ESD duration, ESD energy, ESD
immunity, ESD risetime, ESD upsets, ESD voltage, Ferrite beads/sleeves,
Filters, Floating inputs, Gas tubes, Grounding, Guard rings, Human body model
(HBM), Humidity, Latch-up, Lead-length effects, Magnetic field, Metal-oxide
varistors (MOV's), Openings, Printed circuit boards (PCB's), Resistors,
Shielding, Slots, Soft errors, Spacing, Spark gaps, Transient voltage
suppressors (TVS's), Triboelectric charging, Triboelectric series, Zener
diodes.
[42] Hellstrom, Sten, ESD-- The Scourge of Electronics. Springer, New York, 1998.
[43] Hey, John C., and Kram, William P., Transient Voltage
Suppression Manual, 2nd ed. General Electric, 1978. (chapters 1-8,
pages 1-107)
Keywords: Clamps, Crowbars, ESD damage, Gas tubes, Lead-length effects,
Leakage current, Lightning protection, Metal-oxide varistors (MOV's), Response
time, Spark gaps, Thyristors, Zener diodes.
[44] Jowett, Charles E., Electrostatics in the Electronics
Environment. John Wiley & Sons, New York, 1976.
Keywords: ESD damage, ESD immunity, Failure modes, Human body model (HBM),
Leakage current, Resistors.
[45] Keiser, Bernhard E., Principles of Electromagnetic
Compatibility. Artech House, Dedham, MA, 1979. (section 3.2, pages
46-54)
Keywords: Clamps, Electromagnetic pulse (EMP) protection, ESD damage, ESD
imunity, ESD upsets, Filters, Lead-length effects, Lightning protection,
Metal-oxide varistors (MOV's), Shielding, Transient voltage suppressors
(TVS's), Zener diodes.
[46] Keiser, Bernhard, Principles of Electromagnetic Compatibility
3rd ed. Artech House, Norwood, MA, 1987. (section 3.2, pages 47-55)
Keywords: Clamps, Electromagnetic pulse (EMP) protection, ESD damage, ESD
immunity, ESD upsets, Filters, Lead-length effects, Lightning protection,
Metal-oxide varistors (MOV's), Shielding, Transient voltage suppressors
(TVS's), Zener diodes.
[47] Kimmel, William D, and Gerke, Daryl D., Electromagnetic
Compatibility in Medical Equipment. IEEE Press and Interpharm Press,
Piscataway, NY, 1995.
Keywords: Air discharge, Analog circuits, Antennas, Bandwidth, Bonding,
Bypassing/decoupling, Cable entry points, Cables, Capacitors, Checkpoints,
Checksums, Clamps, Conductive coatings, Conductive plating, Connectors,
Contact discharge, Controls, Corrosion, Crowbars, Direct discharge, Electric
field, Enclosures/housings, ESD damage, ESD frequency range, ESD risetime, ESD
standards, ESD testing, ESD upsets, ESD voltage, Failure modes, Ferrite
beads/sleeves, Filters, Furniture ESD, Galvanic series, Gaskets, Ground grids,
Ground planes, Grounding, Hangs, Human body model (HBM), Humidity, Indicators,
Indirect discharge, Interrupts, Input/Output (I/O circuits, Lead-length
effects, Liquid Crystal Display (LCD) panels, Lock-ups, Loop area, Magnetic
field, Metal-oxide varistors (MOV's), Openings, Pigtails, Power supplies,
Printed circuit boards (PCB's), Range checking, Redundancy, Resets, Resistors,
Response time, Seams, Shielding, Software, Spark gaps, Switches, Tokens,
Transient voltage suppressors (TVS's), Triboelectric charging, Triboelectric
series, Type checking, Watchdog timers, Weather, Zener diodes.
[48] Kimmel, William D. and Gerke, Daryl D., EMI Suppression Handbook: Communiques from the Trenches. Seven Mountains Scientific, Boalsburg, PA, 1998.
[49] Kodali, V. Prasad, Engineering Electromagnetic
Compatibility. IEEE Press, Piscataway, NJ, 1996. (Sections 2-4, 8-3,
and 9-2, pages 26-31, 159-171, and 203)
Keywords: Air discharge, Arcing, Capacitance, Case histories, Contact
discharge, Corona, Direct discharge, Electric field, Electromagnetic pulse
(EMP) protection, ESD current, ESD damage, ESD duration, ESD energy, ESD
frequency range, ESD risetime, ESD simulator (human body model), ESD testing,
ESD upsets, ESD voltage, ESD waveform, Furniture ESD, Grounding, Humidity,
Human body model (HBM), Indirect discharge, Magnetic field, Triboelectric
charging, Triboelectric series, Weather.
[50] Lacy, Edward A., Protecting Electronic Equipment from
Electrostatic Discharge. Tab Books, Blue Ridge Summit, PA, 1984.
(Chapter 1, Section 5.1, pages 1-19,82-83)
Keywords: Antennas, Case histories, Direct discharge, Electric field, ESD
damage, ESD immunity, ESD upsets, ESD voltage, Grounding, Humidity, Indirect
discharge, Input protection, Metal-oxide varistors (MOV's), MOSFET's, Output
protection, Printed circuit boards (PCB's), Resistors, Shielding, Shunting,
Spark gaps, Transient voltage suppressors (TVS's), Triboelectric charging,
Weather, Zener diodes.
[51] Lee, P. A., and Anderson, T., Fault Tolerance-- Principles and
Practices 2nd edition. Springer-Verlag, New York, 1981. (Chapters 3,
5, and 7, pages 51-69, 95-121, and 143-187)
Keywords: Audit trails, Checkpoints, Cold start, Diagnostics,
Error-correcting codes (ECC), Error detection, Error logging, Error recovery,
Exception handling, Fault tolerance, Input checks, Output checks, Parity,
Range checking, Redundancy, Resetting, Run-time checks, Safe state, Sampling
data, Software, Warm start, Watchdog timers.
[52] Lide, David R., and Frederikse, H. P. R., CRC Handbook of
Chemistry and Physics, 78th ed. CRC Press, New York, 1997-1998.
(pages 8-20 to 8-30)
Keywords: Galvanic series.
[53] Mardiguian, Michel, Cookbook of EMI Fixes. ICT
Publishing Group, Gainesville, VA, 1989.
Keywords: Aluminum tape, Bonding, Cable entry points, Cables, Capacitors,
Conductive paints, Connectors, Controls, Copper tape, Current probes, Direct
discharge, Enclosures/housings, ESD current, ESD immunity, ESD simulator
(other), ESD testing, ESD upsets, Ferrite beads/sleeves, Feedthrough
capacitors, Filters, Gaskets, Ground straps, Grounding, Humidity, Indirect
discharge, Keyboards, Metal-oxide varistors (MOV's), Openings, Seams, Sharp
edges/points, Shielding, Shunting, Switches, Transient voltage suppressors
(TVS's), Weather.
[54] Mardiguian, Michel, Electromagnetic Control in Components and
Devices Volume 5. Interference Control Technologies, Gainesville, VA,
1988. (Sections 3.1, 3.6, 4.4.2, 4.7, 5.3, 6.1.6, 6.4, and 7, pages 3.2-3.5,
3.39-3.40, 4.106-4.119, 4.151-4.167, 5.17-5.28, 6.17-6.20, 6.40-6.53, and
7.1-7.19)
Keywords: Charged device model (CDM), Clamps, Connectors, CMOS devices,
Crowbars, Electro-explosive devices (EED's), ESD energy, ESD immunity, ESD
voltage, Failure modes, Filters, Gas tubes, Human body model (HBM),
Metal-oxide varistors (MOV's), Noise immunity, Response time, Scaling laws,
Spark gaps, Switches, Transient voltage suppressors (TVS's), Triboelectric
charging, Triboelectric series, Zener diodes.
[55] Mardiguian, Michel, Electrostatic Discharge: Understand,
Simulate and Fix ESD Problems. Interference Control Technologies,
Gainesville, VA, 1993.
Keywords: Air discharge, Aluminum tape, Analog circuits, Antennas, Arcing,
Bandwidth, Bipolar devices, Bonding, Bypassing/decoupling, Cable entry points,
Cables, Capacitance, Capacitors, Case histories, Charged device model (CDM),
Checksums, Clamps, CMOS devices, Conductive coatings, Conductive paints,
Conductive plating, Connectors, Contact discharge, Controls, Copper tape,
Corona, Corrosion, Current probes, Diagnostics, Direct discharge, Electric
field, Enclosures/housings, Error logging, Error recovery, ESD charge, ESD
current, ESD current path, ESD duration, ESD energy, ESD frequency range, ESD
immunity, ESD risetime, ESD simulator (charged device model), ESD simulator
(human body model), ESD standards, ESD testing, ESD voltage, ESD waveform,
Failure modes, Fasteners, Fault tolerance, Ferrite beads/sleeves, Filters,
Floating inputs, Furniture ESD, Gaskets, Ground planes, Ground straps, Ground
wires, Grounding, Hand/tool model, Human body model (HBM), Humidity,
Indicators, Indirect discharge, Inductance, Inductive charging, Input/Output
(I/O) circuits, Intermittent errors, Latch-up, Keyboards, Latch-up, Leakage
current, Loop area, Magnetic field, Memory access time, Memory errors,
Metal-oxide varistors (MOV's), Noise immunity, Openings, Optoisolators,
Parity, Paschen's Law, Pigtails, Power cords, Power distribution, Power supply
monitors, Printed circuit boards (PCB's), Resetting, Resistance, Resistors,
Sampling data, Scaling laws, Seams, Secondary arcs, Shielding, Showering arcs,
Shunting, Slots, Software, Spacing, Spark gaps, Static dissipaters, Switches,
Transfer Impedance, Transient voltage suppressors (TVS's), Triboelectric
charging, Triboelectric series, Unused memory, Watchdog timers, Weather, Zener
diodes.
[56] Mardiguian, Michel, EMI Troubleshooting Techniques.
McGraw-Hill, New York, 2000.
Keywords: Aluminum tape, Blocking, Bonding, Capacitors, Clamps, Conductive
paints, Connectors, Controls, Copper tape, Crowbars, Current probes,
Diagnostics, Direct discharge, Error detection, Error recovery, ESD current
path, ESD simulator (human body model), ESD standards, ESD testing, ESD
waveform, Feedthrough capacitors, Ferrite beads/sleeves, Filters, Gas tubes,
Gaskets, Ground straps, Humidity, Indicators, Indirect discharge, Keyboards,
Metal-oxide varistors (MOV's), Printed circuit boards (PCB's), Seams,
Shielding, Shunting, Slots, Software, Switches, Transfer Impedance, Transient
voltage suppressors (TVS's), Weather.
[57] Mardiguian, Michel, Grounding and Bonding Volume 2.
Interference Control Technologies, Gainesville, VA, 1988.
Keywords: Bonding, Cables, Conductive coatings, Connectors, Corrosion,
Electromagnetic pulse (EMP) protection, ESD frequency range, Galvanic series,
Gaskets, Ground planes, Ground straps, Ground wires, Grounding, Lightning
protection, Shielding.
[58] Marshman, Chris, The Guide to the EMC Directive
89/336/EEC. IEEE Press, Piscataway, NJ, 1992. (section 7.2, pages
121-136)
Keywords: Air discharge, Contact discharge, Direct discharge, ESD immunity,
ESD simulator (human body model), ESD standards, ESD testing, ESD upsets, ESD
voltage, Failure modes, Human body model (HBM), Humidity, Indirect discharge,
Performance criteria.
[59] McAteer, Owen J., Electrostatic Discharge Control.
McGraw-Hill, New York, 1990. (section 12.12, pages 339-340)
Keywords: Charged device model (CDM), CMOS devices, ESD damage, ESD immunity,
ESD simulator (human body model), ESD standards, ESD testing, ESD upsets, ESD
voltage, ESD waveform, Field-induced breakdown (FIB), Galvanic series,
Hand/tool model, Human body model (HBM), Humidity, Latch-up, Machine Model
(MM), Metal-oxide varistors (MOV's), MOSFET's, Resistors, Transient voltage
suppressors (TVS's), Triboelectric charging, Triboelectric series.
[60] Montrose, Mark I., EMC and the Printed Circuit Board-- Design,
Theory, and Layout Made Simple. IEEE Press, Piscataway, NJ, 1999.
(Chapter 4 and Appendix D, pages 81-124 and 311-315)
Keywords: Direct discharge, ESD damage, ESD frequency range, ESD risetime,
ESD standards, ESD upsets, Ground grids, Ground planes, Indirect discharge,
Performance criteria.
[61] Montrose, Mark I., Printed Circuit Board Design Techniques for
EMC Compliance. IEEE Press, Piscataway, NJ, 1996. (chapters 5 and 6,
pages 117-155)
Keywords: Bandwidth, Blocking, Bonding, Bypassing/decoupling, Cables,
Capacitors, Charge injection, CMOS devices, Connectors, Direct discharge,
Electric field, ESD current, ESD damage, ESD frequency range, ESD immunity,
ESD risetime, ESD upsets, Ferrite beads/sleeves, Filters, Ground fill, Ground
planes, Ground straps, Grounding, Guard rings, Indirect discharge, Keyboards,
Latch-up, Lock-ups, Loop area, Magnetic field, Metal-oxide varistors (MOV's),
Openings, Pigtails, Printed circuit boards (PCB's), Resistors, Response time,
Shielding, Shunting, Slots, Spacing, Spark gaps, Transient voltage suppressors
(TVS's), Triboelectric charging, Triboelectric series.
[62] Montrose, Mark I., Printed Circuit Board Design Techniques for
EMC Compliance, 2nd ed. IEEE Press, Piscataway, NJ, 2000. (Chapters 5
and 6, pages 151-191)
Keywords: Bandwidth, Blocking, Bonding, Bypassing/decoupling, Cables,
Capacitors, Charge injection, CMOS devices, Connectors, Direct discharge,
Electric field, ESD current, ESD damage, ESD frequency range, ESD immunity,
ESD risetime, ESD upsets, Ferrite beads/sleeves, Filters, Ground fill, Ground
planes, Ground straps, Grounding, Guard rings, Indirect discharge, Keyboards,
Latch-up, Lock-ups, Loop area, Magnetic field, Metal-oxide varistors (MOV's),
Openings, Pigtails, Printed circuit boards (PCB's), Resistors, Response time,
Shielding, Shunting, Slots, Spacing, Spark gaps, Transient voltage suppressors
(TVS's), Triboelectric charging, Triboelectric series.
[63] Morrison, Ralph and Lewis, Warren H., Grounding and Shielding in
Facilities. John Wiley & Sons, New York, 1990. (sections 7.29-7.32,
pages 204-207)
Keywords: Air discharge, Cables, Contact discharge, ESD current, ESD energy,
ESD immunity, ESD risetime, ESD testing, Gaskets, Ground straps, Humidity,
Openings, Triboelectric charging, Weather.
[64] Morrison, Ralph, Grounding and Shielding Techniques in
Instrumentation, 2nd ed. John Wiley & Sons, New York, 1977. (Section
9.11, pages 128-129)
Keywords: Ground planes, Loop area.
[65] Morrison, Ralph, Noise and Other Interfering Signals.
John Wiley & Sons, New York, 1992.
Keywords: Bonding, Cables, Electric field, Enclosures/housings, ESD current,
ESD current path, ESD energy, ESD frequency range, ESD risetime, Ground
planes, Humidity, Openings, Spacing.
[66] Morrison, Ralph, Solving Interference Problems in
Electronics. John Wiley & Sons, New York, 1995. (Chapters 9 and 12,
pages 162-176 and 191-193)
Keywords: Air discharge, Bonding, Cable entry points, Cables, Case histories,
Conductive fillers, Conductive paints, Conductive plating, Connectors, Contact
discharge, ESD current, ESD current path, ESD damage, ESD energy, ESD
frequency range, ESD immunity, ESD risetime, ESD testing, Humidity,
Metal-oxide varistors (MOV's), Pigtails, Resistors, Seams, Shielding.
[67] Ott, Henry W., Noise Reduction Techniques in Electronic Systems,
2nd ed. John Wiley & Sons, New York, 1988.
Keywords: Blocking, Bonding, Bypassing/decoupling, Cable entry points,
Cables, Capacitors, Charge injection, Checkpoints, Checksums, CMOS devices,
Conductive coatings, Conductive fillers, Conductive paints, Conductive
plating, Connectors, Controls, Cyclic redundancy check (CRC), Electric field,
Enclosures/housings, Error-correcting codes (ECC), Error detection, Error
recovery, ESD current path, ESD damage, ESD risetime, ESD simulator (human
body model), ESD upsets, ESD voltage, ESD waveform, Ferrite beads/sleeves,
Filters, Floating inputs, Galvanic series, Gaskets, Ground planes, Grounding,
Guard rings, Hangs, Human body model (HBM), Inductive charging, Input/Output
(I/O) errors, Interrupts, Keyboards, Latch-up, Lock-ups, Loop area, Magnetic
field, Memory errors, Openings, Parity, Pigtails, Printed circuit boards
(PCB's), Range checking, Resetting, Resistors, Sampling data, Seams, Secondary
arcs, Shielding, Spacing, Software, Transfer Impedance, Triboelectric
charging, Triboelectric series, Unused memory, Watchdog timers.
[68] Paul, Clayton R., Introduction to Electromagnetic
Compatibility. John Wiley & Sons, New York, 1992. (Chapter 12, pages
667-689)
Keywords: Arcing, Blocking, Bonding, Cable entry points, Cables, Capacitors,
Charge injection, Checksums, Clamps, Common-mode chokes, Conductive fillers,
Conductive paints, Current probes, Double-sided boards, Edge-triggered logic,
Electric field, Enclosures/housings, Error-correcting codes (ECC), Error
detection, Error recovery, ESD charge, ESD current, ESD damage, ESD frequency
range, ESD immunity, ESD risetime, ESD testing, ESD upsets, ESD voltage, ESD
waveform, Ferrite beads/sleeves, Filters, Floating inputs, Furniture ESD,
Gaskets, Ground grids, Ground planes, Grounding, Human body model (HBM),
Humidity, Inductive charging, Keyboards, Lead-length effects, Loop area,
Magnetic field, Memory errors, Multilayer boards, Openings, Optoisolators,
Parity, Pigtails, Power cords, Power distribution, Printed circuit boards
(PCB's), Resets, Response time, Sampling data, Seams, Secondary arcs,
Shielding, Showering arcs, Shunting, Slots, Software, Spacing, Static
dissipaters, Transient voltage suppressors (TVS's), Triboelectric charging,
Triboelectric series, Watchdog timers, Zener diodes.
[69] Perez, Reinaldo, Handbook of Electromagnetic
Compatibility. Academic Press, New York, 1995.
Keywords: Air discharge, Antennas, Arcing, Bipolar devices, Bonding, Cables,
Case histories, Charge injection, Charged device model (CDM), CMOS devices,
Common-mode chokes, Conductive plating, Contact discharge, Controls, Corona,
Direct discharge, Electric field, Electromagnetic pulse (EMP) protection,
Enclosures/housings, ESD current, ESD damage, ESD frequency range, ESD
immunity, ESD simulator (human body model), ESD standards, ESD testing, ESD
voltage, ESD waveform, Ferrite beads/sleeves, Filters, Furniture ESD, Gaskets,
Ground fill, Ground grids, Grounding, Human body model (HBM), Humidity,
Indirect discharge, Inductive charging, Input/Output (I/O) errors, Keyboards,
Latch-up, Lightning protection, Lock-ups, Loop area, Machine Model (MM),
Magnetic field, Memory errors, Multilayer boards, Openings, Pigtails, Printed
circuit boards (PCB's), Program flow errors, Resets, Response time, Seams,
Secondary arcs, Shielding, Showering arcs, Software, Spacing, Triboelectric
charging, Triboelectric series.
[70] Schaffert, R. M., Electrophotography. Focal Press, New
York, 1965.
Keywords: Paschen's Law, Spark gaps.
[71] Schaffner EMC Inc., Electromagnetic Compatibility.
Union, NJ, June 1985. (Chapter 3, pages 41-59)
Keywords: Arcing, Bonding, Conductive coatings, Controls, Electric field,
Enclosures/housings, ESD charge, ESD current, ESD damage, ESD duration, ESD
energy, ESD frequency range, ESD risetime, ESD simulator (human body model),
ESD standards, ESD testing, ESD voltage, Filters, Gaskets, Hand/tool model,
Humidity, Magnetic field, Memory errors, Noise-energy immunity, Noise
immunity, Openings, Program flow errors, Seams, Shielding, Switches,
Triboelectric charging.
[72] Smith, Douglas C., High Frequency Measurements and Noise in
Electronic Circuits. Van Nostrand Reinhold, New York, 1993.
Keywords: Capacitive coupling, Current probes, Electric field, ESD current,
ESD damage, ESD sources, ESD risetime, ESD standards, ESD testing, ESD upsets,
ESD voltage, High-frequency measurements, Inductive coupling, Lead-length
effects, Magnetic field.
[73] Standler, Ronald B., Protection of Electronic Circuits from Overvoltages. John Wiley & Sons, New York, 1989.
[74] Sweeney, Peter, Error Control Coding. Prentice Hall, New York, 1991.
[75] Tihanyi, Laszlo, Electromagnetic Compatibility in Power
Electronics. IEEE Press, New York, 1995. (section 10.2.3, pages
262-265)
Keywords: Air discharge, Capacitance, Capacitors, Clamps, Contact discharge,
Crowbars, ESD current, ESD duration, ESD risetime, ESD simulator (human body
model), ESD standards, ESD testing, Feedthrough capacitors, Filters, Gas
tubes, Ground grids, Ground planes, Grounding, Lead-length effects,
Metal-oxide varistors (MOV's), Multifunction capacitors (MFC's), Printed
circuit boards (PCB's), Response time, Shielding, Shunting, Transient voltage
suppressors (TVS's).
[76] Troutman, Ronald R., Latchup in CMOS Technology: The Problem
and Its Cure. Kluwer Academic Publishers, Boston, MA, 1986.
Keywords: CMOS devices, ESD damage, ESD upsets, Input protection, Latch-up,
Output protection, Parasitic SCR, Response time.
[77] Tsaliocich, Anatoly, Electromagnetic Shielding Handbook for Wired and Wireless EMC Applications. Kluwer Academic Publishers, Boston, MA, 1999.
[78] Violette, J. L. Norman, Noise Control & Design Considerations
in High Performance Electronic Circuits & Systems. Violette Corp.,
Falls Church, VA, 1993.
Keywords: Blocking, Bonding, Bypassing/decoupling, Capacitance, Capacitors,
Clamps, Crowbars, Ferrite beads/sleeves, Ground planes, Metal-oxide varistors
(MOV's), Noise immunity, Response time, Shunting, Transient voltage
suppressors (TVS's), Zener diodes.
[79] Weston, David A., Electromagnetic Compatibility: Principles and
Applications. Marcel Dekker, New York, 1991.
Keywords: Bonding, Capacitors, Conductive coatings, Conductive fabrics,
Conductive fillers, Conductive paints, Connectors, Corrosion, Current probes,
Discoidal capacitors, Electromagnetic pulse (EMP) protection,
Enclosures/housings, ESD risetime, Feedthrough capacitors, Ferrite
beads/sleeves, Gas tubes, Gaskets, Ground planes, Grounding, Lightning
protection, Metal-oxide varistors (MOV's), Noise-energy immunity, Noise
immunity, Openings, Printed circuit boards (PCB's), Resistors, Response time,
Seams, Shielding, Transfer Impedance, Transient voltage suppressors (TVS's),
Zener diodes.
[80] White, Donald R. J., A Handbook Series on Electromagnetic
Interference and Compatibility Volume 3: EMI Control Methods and
Techniques. Don White Consultants, Germantown, MD, 1973.
Keywords: Bonding, Capacitors, Controls, Corrosion, Electro-explosive devices
(EED's), Filters, Galvanic series, Gaskets, Seams, Shunting.
[81] Williams, Tim, EMC for Product Designers. Newnes,
Oxford, England, 1996.
Keywords: Air discharge, Bonding, Cables, Cable entry points, Cable routing,
Capacitors, Checksums, Common-mode chokes, Computer crashes, Conductive
coatings, Conductive fillers, Conductive paints, Conductive plating,
Connectors, Contact discharge, Controls, Data errors, Diagnostics, Direct
discharge, Edge-triggered logic, Electro-explosive devices (EED's),
Enclosures/housings, Error-correcting codes (ECC), Error detection, Error
recovery, ESD current, ESD damage, ESD risetime, ESD simulator (human body
model), ESD standards, ESD upsets, ESD testing, ESD voltage, ESD waveform,
Feedthrough capacitors, Ferrite beads/sleeves, Filters, Galvanic series, Gas
tubes, Gaskets, Ground planes, Ground wires, Hand/tool model, Human body model
(HBM), Humidity, Indirect discharge, Inductive coupling, Intermittent errors,
Interrupts, Keyboards, Lead-length effects, Level-sensitive logic, Loop area,
Memory errors, Metal-oxide varistors (MOV's), Metalized fabric, Multifunction
capacitors (MFC's), Noise-energy immunity, Noise immunity, Optoisolators,
Lock-ups, Magnetic field, Openings, Parity, Pigtails, Printed circuit boards
(PCB's), Program flow errors, Range checking, Refreshing, Resetting, Sampling
data, Seams, Shielding, Shunting, Slots, Software, Spacing, Spark gaps,
Strobing data, Switches, Transfer Impedance, Triboelectric charging,
Triboelectric series, Unused memory, Watchdog timers, Zener diodes.
[82] Williams, Tim, and Armstrong, Keith, EMC for Systems and
Installations. Newnes, Boston, 2000. (Section 10.2.2, pages 257-261)
Keywords: Air discharge, Bonding, Cable routing, Cables, Clamps, Connectors,
Contact discharge, Crowbars, Electric field, ESD current, ESD duration, ESD
risetime, ESD standards, ESD testing, ESD upsets, ESD waveform, Ferrite
beads/sleeves, Filters, Galvanic series, Gas tubes, Gaskets, Ground straps,
Ground wires, Human body model (HBM), Lightning protection, Magnetic field,
Metal-oxide varistors (MOV's), Openings, Seams, Shielding, Slots, Thyristors,
Transfer Impedance, Transient voltage suppressors (TVS's).
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